It is known that low-reflection regions shift toward long-wavelength regions

with the increasing period of nanostructures [5–8]. The reflectance measurement result reveals the fact that HF concentration affected the period of the Si nanostructures. In other words, high HF concentration increased the period of the resulting Si nanostructures. Figure 3 Measured hemispherical reflectance spectra and estimated average height and number of structures. (a) Measured hemispherical reflectance spectra of the Si nanostructures fabricated using different HF concentrations from 4% to 25% in an aqueous solution. (b) Estimated average height and number of structures within a unit area as a function of HF concentration. To investigate the effects see more of HF find more concentration on the period and height of Si nanostructures produced by MaCE, a number of structures within a unit area

and average height were roughly estimated from SEM images. With increasing HF concentration, the counted number of structures decreased, which means that the period of the fabricated Si nanostructures increased. This is primarily due to the enhancement of lateral etching of Si MaCE because the lateral etching of Si can be enhanced by increasing HF concentration, when the oxidant is sufficient for providing extra positive holes (h+) from the etching front (i.e., metal/silicon interface) to the side of the already formed Si nanostructures [11, 15]. Hence, the nanostructures can disappear without distinguishable structure formation, leading to the period increases, if the lateral etching is larger

than the radius of the nanostructures [11]. The average height of the Si nanostructures increased from 308 ± 22 to 1,085 ± 147 nm as the HF concentration increased. This is due to the fact that the overall etching rate was influenced by the removal of oxidized Si by HF when the oxidant was sufficient for generating oxidized Si [15]. For this reason, the measured hemispherical reflectance decreases as the HF concentration increases. It is worth noting that the calculated SWR increased from MycoClean Mycoplasma Removal Kit 5.20% to 7.62% as the HF concentration increased from 8% to 14% even though the height of the Si nanostructures much increased. This is mainly because the main energy density region of the solar energy spectrum is located in the short-wavelength region (around 500 nm). This indicates that the HF concentration is crucial for obtaining Si nanostructures with desirable distribution for practical solar cell applications. Figure 4a,b shows the measured hemispherical reflectance spectra and the average height and calculated SWR of the resulting Si nanostructures depending on the etchant concentration (i.e., different quantities of DI water). The etchant concentration was adjusted from 14% to 33% in an aqueous solution by adjusting the quantity of DI water while fixing the volume ratio of HNO3 and HF (4:1 v/v).